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Revision as of 17:13, 25 April 2011
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<p>[http://www.brltest.com/index.php?main_page=product_info&cPath=27_2702&products_id=3872 Get HP 8712B data sheet here]<br> [http://www.brltest.com/index.php?main_page=product_info&cPath=27_2702&products_id=3872 Request an HP 8712B quote here]
<p>[http://www.brltest.com/index.php?main_page=product_info&cPath=27_2702&products_id=3872 Get HP 8712B data sheet here]<br> [http://www.brltest.com/index.php?main_page=product_info&cPath=27_2702&products_id=3872 Request an HP 8712B quote here]
<p>[[image:Used_Test_Equipment_bnr.jpg|left]]
<p>[[image:Used_Test_Equipment_bnr.jpg|left]]
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Standard Options 8712B<br>
[http://brltest.com/ BRL Test website]
75 ohms (Option 1EC) <br>
Provides 75 ohm system impedance.
AM delay (Option 1DA/1DB)
This option adds amplitude modulation group
delay capability, which allows measurements of
group delay through frequency-translation devices
such as tuners or mixers. Using two external scalar
detectors (86200B or 86201B) and a power splitter
(all included) this option measures group delay in
any device that does not have limiting circuits, saturated amplifiers, or automatic gain control.<br>
Option 1DA is for a 50 ohm 8712B or 8714B.<br>
Option 1DB is for a 75 ohm 8712B or 8714B.<br>
IBASIC (Option 1C2)
This option adds a resident BASIC system controller, facilitating automated measurements and
control of other devices. Using keystroke recording
for the simplest applications, or an optional keyboard to write complex control and calculation
programs, IBASIC improves productivity by customizing your measurements.<br>
Step attenuator (Option 1E1)
This option adds a built-in 60 dB step attenuator,
extending the source output power low-end range
to –60 dBm.<br>
Fault location and structural return loss software (Option
100)
For fully characterizing cable performance, this
software package provides both fault location and
structural return loss. Structural return loss is a
special case of return loss measurements. Physical
damage of cable, by handling or manufacturing
process, causes reflections. Structural return loss
occurs when these periodic reflections sum at halfwavelength spacing and reflect the input signal.<br>
Special Options<br>
Switching test sets (Special Option K02)
Switching test sets enhance productivity by allowing multiple measurements with a single connection to the device under test. They are available in
several configurations<br>
[http://brltest.com/ BRL Test website]<br>
[http://www.brltest.com/ BRL Test website]
[http://www.brltest.com/ BRL Test website]
